DS/ENV 50218:1997 ( Withdrawn )

Description of a parametrized European mini test chip


Status:
Withdrawn
Type:
Standard
Language:
English
Price from:
€ 56.86

Scope

This publication documents the parametrized MOS test structures of the device model Parameter extraction Test Chip (PTC) of the European Mini Test Chip (ETC). The devices of the PTC are a subset of the devices of the ETC. The modules of the ETC provide a minimum set of test structures used to characterize a MOS technology. The test structures of the ETC are generated automatically by a computer program for a given MOS technology.

Number of pages: 24

Published: 1998-03-09

Date of approval: 1997-08-14

Date of withdrawal: 2007-03-27

International relationships : ENV 50218:1996 IDT

ICS: 35.240.01 - Application of information technology in general 31.200 - Integrated circuits. Microelectronics

Item number: 26508